Patent · US Expired

Flash memory element and manufacturing method thereof

US6768158B2 · kind B2 · utility

57Cited by
2References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 4, 2002
Grant dateJul 27, 2004
Priority date
Expiry dateSep 4, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/6213

Abstract

The present invention provides a flash memory element and its manufacturing method having improved overall memory characteristics by constituting a double-gate element for improving the scaling down characteristic of flash memory element. With the above double-gate flash memory structure, a flash memory element in the present invention improves the scaling down characteristic and the programming and retention characteristic of a flash memory element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.