Patent · US Expired

Nonvolatile memory and method of operation thereof to control erase disturb

US6768671B1 · kind B1 · utility

6Cited by
12References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 5, 2003
Grant dateJul 27, 2004
Priority date
Expiry dateMar 5, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3418
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In an array of nonvolatile memory cells, as many memory cells as desired and indeed even the entire array of memory cells may be placed in a single region of the bulk, illustratively a p-well. Peripheral circuitry is used to in effect section the memory array into blocks and groups of blocks, and to establish suitable biasing and counter-biasing within those blocks and groups during page or block erase operations to limit erase disturb. Each group is provided with its own set of voltage switches, which furnishes the bias voltages for the various modes of operation, including erase. Each of the voltage switches furnish either a large positive voltage when its group is selected, or a large negative voltage when its group is unselected. The size of the group is established as a compromise between degree of erase disturb and substrate area required for the voltage switches.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.