Incremental offset measurement instrument
US6772528B2 · kind B2 · utility
0Cited by
5References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 23, 2002 |
| Grant date | Aug 10, 2004 |
| Priority date | — |
| Expiry date | Jul 23, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/0007
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An incremental offset measuring instrument is provided. The incremental offset measuring instrument includes a main base; a specimen seat mounted on the main base for resting a specimen; a measuring tool assembly for measuring the specimen; and a movable assembly mounted on the main base, wherein the movable assembly carries the measuring tool assembly, thereby achieving the goal of measuring the specimen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.