Patent · US Expired

Layout design process and system for providing bypass capacitance and compliant density in an integrated circuit

US6775812B2 · kind B2 · utility

3Cited by
13References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 17, 2002
Grant dateAug 10, 2004
Priority date
Expiry dateSep 2, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/00

Abstract

An IC layout design process and system involves placing an adjustable capacitor cell having a plurality of sub-cells, each with a polysilicon shape disposed over a corresponding active area shape. The polysilicon shapes are electrically coupled to a first power rail and the active area shapes are electrically coupled to a second power rail. The sub-cells of the adjustable capacitor cell are operable to be modified to satisfy a density measurement associated with the IC's fabrication flow.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.