Layout design process and system for providing bypass capacitance and compliant density in an integrated circuit
US6775812B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 17, 2002 |
| Grant date | Aug 10, 2004 |
| Priority date | — |
| Expiry date | Sep 2, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D89/00
Abstract
An IC layout design process and system involves placing an adjustable capacitor cell having a plurality of sub-cells, each with a polysilicon shape disposed over a corresponding active area shape. The polysilicon shapes are electrically coupled to a first power rail and the active area shapes are electrically coupled to a second power rail. The sub-cells of the adjustable capacitor cell are operable to be modified to satisfy a density measurement associated with the IC's fabrication flow.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.