Method and system for performing swept-wavelength measurements within an optical system
US6778307B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 28, 2003 |
| Grant date | Aug 17, 2004 |
| Priority date | — |
| Expiry date | Mar 28, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/39
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for performing swept-wavelength measurements within an optical system provides improved operation in resonator-enhanced optical measurement and data storage and retrieval systems. The system includes an illumination subsystem having a swept-wavelength mode, a detection subsystem, an interferometer or an optical resonator interposed in an optical path between the illumination subsystem and the detection subsystem and a time domain analysis subsystem. Multiple resonance points of the optical resonator are detected by the time-domain subsystem when the illumination subsystem is in the swept-wavelength mode in order to determine resonator or interferometer characteristic changes. The resulting information can be used directly as a measurement output, or cavity length information may also be used to adjust the operating wavelength of a constant wavelength mode of the illumination subsystem.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.