METHOD OF STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD OF MODIFYING OPERATION OF DYNAMIC RANDOM ACCESS MEMORY IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT
US6778453B2 · kind B2 · utility
18Cited by
29References
54Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 24, 2003 |
| Grant date | Aug 17, 2004 |
| Priority date | — |
| Expiry date | Feb 24, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/4078
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for storing a temperature threshold in an integrated circuit includes measuring operating parameters of the integrated circuit versus temperature, calculating a maximum temperature at which the integrated circuit performance exceeds predetermined specifications and storing parameters corresponding to the maximum temperature in a comparison circuit in the integrated circuit by selectively blowing fusable devices in the comparison circuit. The fusable devices may be antifuses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.