Electron device testing apparatus having high current and low current testing features
US6781364B2 · kind B2 · utility
3Cited by
6References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 10, 2003 |
| Grant date | Aug 24, 2004 |
| Priority date | — |
| Expiry date | Jan 10, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31905
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing apparatus for testing an electron device, has a first supply unit that supplies a first current to the electron device; a first feedback circuit which feeds back voltage applied to the electron device to the, first supply unit; a first switch which switches to whether or not connect electrically the electron device to the first feedback circuit; a second supply unit that supplies a second current to the electron device, the second supply unit being separated from the electron device by the first switch.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.