Patent · US Expired

Methods for forming aligned fuses disposed in an integrated circuit

US6784043B2 · kind B2 · utility

4Cited by
10References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 14, 2003
Grant dateAug 31, 2004
Priority date
Expiry dateFeb 25, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/14
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit includes a first conductive layer, an insulator layer disposed on the first conductive layer, and a second conductive layer disposed on the insulator layer. A first fuse is disposed in the first conductive layer and provides a first signal, and a second fuse is disposed in the second conductive layer in alignment with the first fuse and provides a second signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.