Memory device redundant repair analysis method, recording medium and apparatus
US6785852B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 26, 2001 |
| Grant date | Aug 31, 2004 |
| Priority date | — |
| Expiry date | Nov 27, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/72
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory device redundant repair analysis method, recording medium and apparatus allowing a redundant repair analysis method for a memory device with a plurality of redundant repair analysis rules. It is possible to provide a memory device redundant repair analysis method, recording medium and apparatus that allow a redundant repair analysis method for a memory device with a plurality of redundant repair analysis rules by carrying out processing of finally merging a plurality of repair codes corresponding to respective rules obtained by applying a plurality of redundant repair analysis rules into one code. It is also possible to provide a memory device redundant repair analysis method, recording medium and apparatus that allow a redundant repair analysis method for a memory device with a plurality of redundant repair analysis rules by performing processing of appending a plurality of repair codes corresponding to the respective rules obtained by applying a plurality of redundant repair analysis rules to one code after making each analysis determination.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.