Patent · US Expired

Thinning techniques for wafer-to-wafer vertical stacks

US6790748B2 · kind B2 · utility

222Cited by
4References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 19, 2002
Grant dateSep 14, 2004
Priority date
Expiry dateFeb 28, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/977
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Methods for thinning wafer-to-wafer vertical stacks in the fabrication of stacked microelectronic devices. The methods include physically removing unsupported portions of a wafer to be thinned in the vertical stack. The removal of the unsupported portions substantially eliminates potential cracking and chipping of the wafer, which can occur during the thinning process when the unsupported portions exist.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.