Weighted random pattern test using pre-stored weights
US6795948B2 · kind B2 · utility
9Cited by
13References
3Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 27, 2000 |
| Grant date | Sep 21, 2004 |
| Priority date | — |
| Expiry date | Jun 21, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318547
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method of testing an integrated circuit by downloading a sequence of randomly weighted bits into a scan chain in which each bit has a distinctly determined weight generated in real-time by a weight generator. The weight generator has a switch controlled by a stored bit particular for each bit of the randomly weighted bits that determines the weight of the bit. The control signal is stored in a memory that is downloaded into the switch in synchronization with the generation of the bit. Preferably, the memory is on-die, and furthermore is a part of the integrated circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.