Time domain reflectometer probe having a built-in reference ground point
US6798212B2 · kind B2 · utility
11Cited by
5References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 23, 2002 |
| Grant date | Sep 28, 2004 |
| Priority date | — |
| Expiry date | Oct 4, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/11
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe having a built-in reference plane for use with TDR testing includes a conductive sheet member such as a wire mesh which is attached to a ground input of a TDR system. The conductive sheet is located proximate the tip of the test probe and extends radially from an axis of the test probe thereby providing its own reference ground plane.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.