Charles Odegard
15Patents
4h-index
11Co-inventors
53Inventor score
Filing activity: Sep 14, 2001 → May 21, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6869831B2 | Adhesion by plasma conditioning of semiconductor chip surfaces | Electricity | 25 | Expired |
| US6798212B2 | Time domain reflectometer probe having a built-in reference ground point | Physics | 11 | Expired |
| US6855578B2 | Vibration-assisted method for underfilling flip-chip electronic devices | Electricity | 6 | Expired |
| US7224071B2 | System and method to increase die stand-off height | Emerging Cross-Sectional Technologies | 6 | Expired |
| US7319275B2 | Adhesion by plasma conditioning of semiconductor chip | Electricity | 3 | Expired |
| US7598124B2 | System and method to increase die stand-off height | Emerging Cross-Sectional Technologies | 2 | Active |
| US7550314B2 | Patterned plasma treatment to improve distribution of underfill material | Electricity | 2 | Active |
| US6977429B2 | Manufacturing system and apparatus for balanced product flow with application to low-stress underfilling of flip-chip electronic devices | Electricity | 2 | Expired |
| US7393719B2 | Increased stand-off height integrated circuit assemblies, systems, and methods | Emerging Cross-Sectional Technologies | 2 | Expired |
| US7323362B2 | Manufacturing system and apparatus for balanced product flow with application to low-stress underfilling of flip-chip electronic devices | Electricity | 1 | Expired |
| US7276401B2 | Adhesion by plasma conditioning of semiconductor chip surfaces | Electricity | 1 | Active |
| US7045904B2 | Patterned plasma treatment to improve distribution of underfill material | Electricity | 1 | Expired |
| US7271494B2 | Adhesion by plasma conditioning of semiconductor chip surfaces | Electricity | 0 | Expired |
| US7445960B2 | Adhesion by plasma conditioning of semiconductor chip | Electricity | 0 | Active |
| US8674504B2 | Wire-based methodology of widening the pitch of semiconductor chip terminals | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.