Method and apparatus for analyzing measurements
US6799144B2 · kind B2 · utility
11Cited by
9References
74Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2001 |
| Grant date | Sep 28, 2004 |
| Priority date | — |
| Expiry date | Nov 1, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2218/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.