Patent · US Expired

Method to salicide source-line in flash memory with STI

US6803273B1 · kind B1 · utility

9Cited by
4References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 18, 2000
Grant dateOct 12, 2004
Priority date
Expiry dateMay 18, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00

Abstract

A method of forming a semiconductor component having a conductive line (24) and a silicide region (140) that crosses a trench (72). The method involves forming nitride sidewalls (130) to protect the stack during the silicidation process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.