Quantifying a difference between nodal voltages
US6806698B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 19, 2002 |
| Grant date | Oct 19, 2004 |
| Priority date | — |
| Expiry date | Apr 22, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/60
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus that uses the difference between two nodal voltages, such as a temperature-independent voltage and a temperature-dependent voltage, to determine the actual temperature at a point on an integrated circuit is provided. Further, a method and apparatus that converts a difference between nodal voltages in an integrated circuit from an analog to a digital quantity on the integrated circuit such that the difference in voltage may be used by an on-chip digital system is provided. Further, a method and apparatus for quantifying a difference in voltage between a first node and a second node of a temperature sensor is provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.