Patent · US Expired

Semiconductor integrated circuit

US6806726B2 · kind B2 · utility

8Cited by
6References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 2003
Grant dateOct 19, 2004
Priority date
Expiry dateDec 30, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3004
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A semiconductor integrated circuit is segmented into a plurality of blocks. Each block includes a switching transistor which is connected between the CMOS circuit of the block and the ground point and is adapted to shut off the current of the CMOS circuit by being controlled by a test mode control signal, and a leakage current detecting circuit which has a self-check function for the block. A signal which is the logical sum of the outputs of the leakage current detecting circuits of all blocks is the led out of the semiconductor integrated circuit through a common external output terminal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.