Patent · US Expired

Precise monitor etalon calibration technique

US6807205B1 · kind B1 · utility

9Cited by
127References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 10, 2001
Grant dateOct 19, 2004
Priority date
Expiry dateJul 10, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S3/1303
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method for operating an excimer or molecular fluorine laser system at a stabilized wavelength includes generating a laser beam and directing a beam portion through a wavelength measurement system, calibrating the wavelength measurement system to an absolute reference, determining the wavelength of the laser beam including figuring in a drift compensation value of the wavelength, and tuning the wavelength to a target wavelength when the determined wavelength differs from the target wavelength.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.