Patent · US Expired

Configuration in which wafers are individually supplied to fabrication units and measuring units located in a fabrication cell

US6809510B2 · kind B2 · utility

7Cited by
7References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 7, 2001
Grant dateOct 26, 2004
Priority date
Expiry dateFeb 9, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67727
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A configuration for treating wafers in at least one clean room includes a configuration of production units and measuring units that receive wafers via a transport system for transporting cassettes. Several functionally allocated production units and/or measuring units are combined to form a manufacturing cell which is provided with a loading and unloading station for receiving and forwarding cassettes with wafers. Individual wafers can be supplied to the production units and/or measuring units within the manufacturing cell in order to be treated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.