Patent · US Expired

Advanced illumination system for use in microlithography

US6813003B2 · kind B2 · utility

10Cited by
13References
96Claims
0Family size

Inventors

Key dates

Filing dateJun 11, 2002
Grant dateNov 2, 2004
Priority date
Expiry dateJun 19, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70183
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A system for microlithography comprises an illumination source; an illumination optical system including, in order from an objective side, (a) a first diffractive optical element that receives illumination from the illumination source, (b) a zoom lens, (c) a second diffractive optical element, (d) a condenser lens, (e) a relay lens, and (f) a reticle, and a projection optical system for imaging the reticle onto a substrate, wherein the system for microlithography provides a zoomable numerical aperture.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.