Patent · US Expired

Method and apparatus for determining system response characteristics

US6813589B2 · kind B2 · utility

2Cited by
9References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 29, 2001
Grant dateNov 2, 2004
Priority date
Expiry dateMar 21, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03L7/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for determining a response characteristic of an nth order linear system, such as a phase locked loop, is disclosed. An input signal is supplied to the linear system, and the system measures an output signal produced by the linear system. A variance record is constructed for a measurable quantity, such as jitter, extracted from the output signal. The response characteristic of the linear system is then obtained from the variance record. The response characteristic, such as the transfer function, noise processes, and/or power spectral density (PSD), may be found through a numerical or analytical solution to a mathematical relationship between a response function of the nth order linear system and the variance record.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.