Patent · US Expired

Method for treating semiconductor processing components and components formed thereby

US6825123B2 · kind B2 · utility

3Cited by
4References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 15, 2003
Grant dateNov 30, 2004
Priority date
Expiry dateApr 15, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/26
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

A method for treating a semiconductor processing component, including: exposing the component to a halogen gas at an elevated temperature, oxidizing the component to form an oxide layer, and removing the oxide layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.