Patent · US Expired

Method and measuring arrangement for detecting an object

US6825939B2 · kind B2 · utility

1Cited by
7References
36Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 2, 2002
Grant dateNov 30, 2004
Priority date
Expiry dateJul 2, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V20/69
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a method and a measurement apparatus for detection of a specimen (1), a specimen (1) being illuminated with a light source (2) and imaged with the aid of an imaging optical system (3) onto a detector (4) preferably embodied as a CCD camera, and the specimen (1) being detected repeatedly with the detector (4). With the method and the measurement apparatus according to the present invention, fluctuations in the statistical analysis of detected signals or data can be minimized, the detected signals or data being subject to detection-related error sources. The method and the measurement apparatus according to the present invention are characterized in that the detection time of the detector (4) for the individual detections and/or the intensity of the light serving for specimen illumination are varied.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.