Patent · US Expired

Planarizing machines and methods for mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies

US6833046B2 · kind B2 · utility

17Cited by
167References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 24, 2002
Grant dateDec 21, 2004
Priority date
Expiry dateJun 17, 2022

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/042
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

Planarizing machines and methods for selectively using abrasive slurries on fixed-abrasive planarizing pads in mechanical and/or chemical-mechanical planarization of microelectronic substrate assemblies. In one embodiment of a method in accordance with the invention, a microelectronic substrate is planarized by positioning a fixed-abrasive planarizing pad on a table of a planarizing machine, covering at least a portion of a planarizing surface on the pad with a first abrasive planarizing solution during a first stage of a planarizing cycle, and then adjusting a concentration of the abrasive particles on the planarizing surface at a second stage of the planarizing cycle after the first stage. The concentration of the second abrasive particles can be adjusted during the second stage of the planarizing cycle by coating the planarizing surface with a non-abrasive second planarizing solution without abrasive particles during the second stage. The second planarizing solution can be dispensed onto the planarizing surface after terminating a flow of the first planarizing solution at the end of the first stage of the planarizing cycle, or the flow of the first planarizing solution can be co…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.