Patent · US Expired

Multiple work function gates

US6835639B2 · kind B2 · utility

116Cited by
12References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 22, 2002
Grant dateDec 28, 2004
Priority date
Expiry dateNov 22, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/0181

Abstract

A method of forming a first and second transistors with differing work function gates by differing metals deposited to react with a silicon or silicon-germanium gate layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.