Patent · US Expired

Lead frame, and method for manufacturing semiconductor device and method for inspecting electrical properties of small device using the lead frame

US6836004B2 · kind B2 · utility

0Cited by
9References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 15, 2003
Grant dateDec 28, 2004
Priority date
Expiry dateApr 17, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/181
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A lead frame comprises a plurality of frame assemblies. Each framework assembly includes a framework, a suspension lead, a die pad, a plurality of inner leads and outer leads, a first tie bar and a second tie bar, and a lead support. The plurality of framework assemblies are disposed alongside of one another in a direction perpendicular to a direction in which the plurality of outer leads extend. A distance between close-set outer leads in each two neighboring frameworks is substantially n times a pitch of the plurality of outer leads in each framework, wherein n is an integer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.