Patent · US Expired

Methods and apparatus for electropolishing metal interconnections on semiconductor devices

US6837984B2 · kind B2 · utility

6Cited by
25References
35Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 10, 2002
Grant dateJan 4, 2005
Priority date
Expiry dateApr 10, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/7684
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An apparatus for electropolishing a wafer includes a wafer chuck and a stationary jet. The wafer chuck is configured to rotate and translate the wafer. The stationary jet is configured to apply an electrolyte to the wafer when the wafer is translated and rotated by the wafer chuck.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.