Material measure and position measuring device comprising such a material measure

US6844558B1 · kind B1 · utility

Assignee

• DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

• Josef Weidmann · Feichten, DE
• Peter Speckbacher · Kirchweidach, DE

Key dates

• Filing date: Nov 11, 2000
• Grant date: Jan 18, 2005
• Expiry date: Apr 25, 2021

Classification

• Technology area (CPC G): Physics
• CPC primary: G01D5/26
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A material measure includes a carrier substrate having a surface that includes at least one track having first porous subsections and second subsections. The first porous subsections and the second subsections are arranged alternatingly in at least one direction and have different optical properties. The first porous subsections are formed so as to be photoluminescent and the second subsections are formed so as to be non-photoluminescent. A scanning unit may also be provided, wherein the scanning unit is movable relative to the material measure and includes at least one opto-electronic detector element and a light source. The light source applies radiation of a defined wavelength to the material measure, the radiation from the light source being suitable for exciting the photoluminescence in the first subsections of the material measure.