Scatter spectra method for x-ray fluorescent analysis with optical components
US6845147B2 · kind B2 · utility
4Cited by
1References
20Claims
0Family size
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Key dates
| Filing date | Jun 17, 2003 |
| Grant date | Jan 18, 2005 |
| Priority date | — |
| Expiry date | Jun 17, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K1/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring the transfer function of an X-ray optical component over a wide range of X-ray energies, which includes the steps of:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.