EDAX, Incorporated
13Patents
8Active
13Granted
40Portfolio score
Filing activity: Jul 31, 1997 → Dec 20, 2019 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7972062B2 | Optical positioner design in X-ray analyzer for coaxial micro-viewing and analysis | Physics | 20 | Active |
| US6242748A | Methods and apparatus for mounting an X-ray detecting unit to an electron microscope | Electricity | 12 | Expired |
| US6835931B2 | Chemical prefiltering for phase differentiation via simultaneous energy dispersive spectrometry and electron backscatter diffraction | Physics | 8 | Expired |
| US6845147B2 | Scatter spectra method for x-ray fluorescent analysis with optical components | Physics | 4 | Expired |
| US9791390B2 | Devices and systems for spatial averaging of electron backscatter diffraction patterns | Physics | 1 | Active |
| US6176088A | Method and devices to reduce vibrations in a cryostat | Mechanical Engineering; Lighting; Heating | 1 | Expired |
| US11035806B2 | Devices and systems for improved collection efficiency and resolution of wavelength dispersive spectrometry | Electricity | 1 | Active |
| US10656106B2 | Systems and methods for in situ high temperature X-ray spectroscopy in electron microscopes | Electricity | 0 | Active |
| US10139356B2 | Devices and systems for spatial aggregation of spectral analysis from electron microscopes | Physics | 0 | Active |
| US6437337B1 | X-ray detector shape | Electricity | 0 | Expired |
| US8735815B2 | Method and apparatus for electron pattern imaging | Electricity | 0 | Active |
| US10614997B2 | Systems and methods for high energy X-ray detection in electron microscopes | Electricity | 0 | Active |
| US8835842B2 | Systems and methods for investigating a characteristic of a material using electron microscopy | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.