Patent · US Expired

Arrangement and method for the identification of substrates

US6845174B2 · kind B2 · utility

1Cited by

5References

13Claims

0Family size

Assignee

Leica Microsystems Jena GmbH · DE

Inventors

Dominik Grau · Apolda, DE
Andreas Birkner · Jena, DE
Knut Hiltawski · Saalfeld, DE
Frank Bernhardt · Eppelheim, DE

Key dates

Filing date	Jan 18, 2002
Grant date	Jan 18, 2005
Priority date	—
Expiry date	Aug 7, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG06V10/10
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

An arrangement for the identification of a substrate (S) having at least one identification marking (I), comprising A corresponding identification method is also described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.