Method for testing a non-volatile memory
US6845476B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 9, 2001 |
| Grant date | Jan 18, 2005 |
| Priority date | — |
| Expiry date | Jan 15, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention discloses a method for testing a non-volatile memory, characterized in that the code assigned by the client is written in at least one non-volatile memory in advance, and then a particular pin of the non-volatile memory is cut, such as a write enabling pin for avoiding the mistake of rewriting. After restarting a testing machine, the code written in the non-volatile memory is read out to compare it with the code retrieved from a controlling program of the testing machine. If the comparing result is identical, it means that the code retrieved by the controlling program of the testing machine is correct; otherwise, the code retrieved by the controlling program is incorrect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.