Patent · US Expired

Method and apparatus for detecting devices that can latchup

US6848089B2 · kind B2 · utility

3Cited by
13References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 31, 2002
Grant dateJan 25, 2005
Priority date
Expiry dateJul 31, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/398
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and apparratus for for identifying circuits within an integrated circuit design that are likely to latchup. The present invention accomplishes the identification by searching for suspect circuits and then modifying these circuits to represent a device known by an EDA tool (e.g. FET device). The EDA tool can then be used to determine the likelihood of latchup occuring based upon the modified device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.