Patent · US Expired

Method and apparatus for performing multiport through-reflect-line calibration and measurement

US6853198B2 · kind B2 · utility

13Cited by
13References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 2002
Grant dateFeb 8, 2005
Priority date
Expiry dateMar 29, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/28
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for calibrating a measurement path of 2N measurement ports comprises presenting a high reflect calibration standard at each measurement port and measuring a reflection characteristic for each measurement port, presenting a line calibration standard and a through calibration standard between each one of N direct pairs of the measurement ports and measuring forward and reverse reflection and transmission responses and calculating a load match error coefficient for each measurement port, and presenting only the through calibration standard between indirect pairs of measurement ports and calculating the forward and reverse transmission tracking for each indirect pairs of measurement ports.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.