Vahe Adamian
17Patents
11h-index
5Co-inventors
61Inventor score
Filing activity: May 24, 1993 → May 23, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5578932A | Method and apparatus for providing and calibrating a multiport network analyzer | Physics | 153 | Expired |
| US6920407B2 | Method and apparatus for calibrating a multiport test system for measurement of a DUT | Chemistry; Metallurgy | 153 | Expired |
| US6653848B2 | Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices | Physics | 152 | Expired |
| US5434511A | Electronic microwave calibration device | Physics | 33 | Expired |
| US5552714A | Electronic calibration method and apparatus | Physics | 32 | Expired |
| US5467021A | Calibration method and apparatus | Physics | 28 | Expired |
| US5548221A | Electronic calibration method and apparatus | Physics | 22 | Expired |
| US5537046A | Electronic calibration method and apparatus | Physics | 18 | Expired |
| US6826506B2 | Method and apparatus for calibrating a multiport test system for measurement of a DUT | Physics | 16 | Expired |
| US7068049B2 | Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration | Physics | 14 | Expired |
| US6853198B2 | Method and apparatus for performing multiport through-reflect-line calibration and measurement | Physics | 13 | Expired |
| US7019535B2 | Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path | Physics | 9 | Expired |
| US7030625B1 | Method and apparatus for performing a minimum connection multiport through-reflect-line calibration and measurement | Physics | 7 | Expired |
| US6937032B2 | Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit | Physics | 7 | Expired |
| US7157918B2 | Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path | Physics | 7 | Expired |
| US6757625B2 | Method, apparatus, and article of manufacture for predicting electrical behavior of a multiport device having balanced device ports | Physics | 5 | Expired |
| US7126346B2 | Method, apparatus, and article of manufacture for manufacturing high frequency balanced circuits | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.