Patent · US Expired

Ultra high-speed Si/SiGe modulation-doped field effect transistors on ultra thin SOI/SGOI substrate

US6855963B1 · kind B1 · utility

11Cited by
1References
74Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 2003
Grant dateFeb 15, 2005
Priority date
Expiry dateAug 29, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/6748

Abstract

A silicon and silicon germanium based semiconductor MODFET device design and method of manufacture. The MODFET design includes a high-mobility layer structure capable of ultra high-speed, low-noise for a variety of communication applications including RF, microwave, sub-millimeter-wave and millimeter-wave. The epitaxial field effect transistor layer structure includes critical (vertical and lateral) device scaling and layer structure design for a high mobility strained n-channel and p-channel transistor incorporating silicon and silicon germanium layers to form the optimum modulation-doped heterostructure on an ultra thin SOI or SGOI substrate capable of achieving greatly improved RF performance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.