Patent · US Expired

Device and method for measuring jitter in phase locked loops

US6859027B2 · kind B2 · utility

5Cited by
8References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 15, 2002
Grant dateFeb 22, 2005
Priority date
Expiry dateAug 15, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03L7/0891
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A device and method for measuring the jitters of phase locked loop signals. A phase lead or phase lag relationship between an input signal and an output signal of a phase locked loop is found. According to the phase relationship and using multiplexers, a first phase difference signal and a second phase difference signal are re-routed to a subtraction unit and produces a jitter-level output signal. The jitter-level output signal represents the absolute value of the difference of pulse width between the first phase difference signal and the second phase difference signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.