Test fixture for semiconductor package and test method of using the same
US6859056B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 20, 2002 |
| Grant date | Feb 22, 2005 |
| Priority date | — |
| Expiry date | Jun 20, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0408
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test fixture for semiconductor packages and a test method of using the test fixture are proposed. The test fixture is composed of a circuit board, an interposer and a covering member. The circuit board is used to accommodate semiconductor packages and electrically connect the semiconductor packages to a test device. The interposer is mounted on the circuit board, and formed with through holes for receiving the semiconductor packages therein. The covering member is attached onto the interposer, and provided with elastic mechanisms for holding the semiconductor packages in position. By using the test fixture, semiconductor packages can be firmly coupled to the test device where functional tests are performed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.