Transmission mode X-ray diffraction screening system
US6859520B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 20, 2003 |
| Grant date | Feb 22, 2005 |
| Priority date | — |
| Expiry date | Aug 4, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A transmission mode x-ray diffraction screening system has a sample support that holds a sample tray with multiple samples to be tested. The sample support is connected to a translation stage that is movable in three dimensions, and that it offset from the location of the sample support. An x-ray source is located to one side of the sample support, and a detector is located to the other side, thereby allowing the detection of x-rays that are diffracted by the sample in a transmission mode. A retractable beamstop may be located between the sample and the detector to block at least part of the non-diffracted x-rays from the source. A video camera may also be provided for imaging the sample location, which may be illuminated by a laser. The entire system may be automated such that each sample in the sample tray may be sequentially analyzed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.