Patent · US Expired

Flip chip underfill process

US6861285B2 · kind B2 · utility

3Cited by
8References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 4, 2003
Grant dateMar 1, 2005
Priority date
Expiry dateApr 4, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/14
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A die with flip chip bumps including at least one layer of filled underfill on the die surface and a layer of unfilled underfill over the filled underfill and the flip chip bumps. An IC assembly including a substrate with bumps and at least one layer of filled underfill on the substrate surface and a layer of unfilled underfill over the filled underfill and the bumps. A die or IC assembly with a plurality of filled underfill layers with differing CTE. Methods of making the dies and IC assemblies.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.