Patent · US Expired

Trench power MOSFET with planarized gate bus

US6861701B2 · kind B2 · utility

72Cited by
11References
18Claims
0Family size

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Inventors

Key dates

Filing dateMar 5, 2003
Grant dateMar 1, 2005
Priority date
Expiry dateApr 26, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/664

Abstract

Power MOSFETs and fabrication processes for power MOSFETs use a continuous conductive gate structure within trenches to avoid problems arising from device topology caused when a gate bus extends above a substrate surface. The conductive gate structure forms gates in device trenches in an active device region and forms a gate bus in a gate bus trench. The gate bus trench that connects to the device trenches can be wide to facilitate forming a gate contact to the gate bus, while the device trenches can be narrow to maximize device density. CMP process can be used to planarize the conductive gate structure and/or overlying insulating layers. The processes are compatible with processes forming self-aligned or conventional contacts in the active device region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.