Oscillator method and apparatus for a test chip
US6861912B1 · kind B1 · utility
0Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 14, 2003 |
| Grant date | Mar 1, 2005 |
| Priority date | — |
| Expiry date | Sep 23, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K3/0315
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for modifying a frequency of an oscillating signal comprises generating an oscillating signal of a predetermined frequency on a semiconductor device used as an evaluation test chip by connecting a predetermine number of circuit elements in a ring oscillator configuration. A delay element operably coupled into the ring oscillator configuration modifies the predetermined frequency of the ring oscillator configuration. The operable coupling may occur on a semiconductor package containing the semiconductor device or a circuit board containing the semiconductor device. A ring oscillator is also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.