Apparatus and method for investigating a sample
US6865014B2 · kind B2 · utility
25Cited by
6References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2001 |
| Grant date | Mar 8, 2005 |
| Priority date | — |
| Expiry date | Jun 22, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/3581
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for investigating a sample, the apparatus comprising an emitter (1) for irradiating the sample (27) with a beam of emitted electromagnetic radiation; and a detector (49) for detecting the radiation reflected from the sample, wherein there is an optically non-linear member (15) which functions as both an active part of the emitter and an active part of the detector, said emitter and detector using the same part of the optically non-linear member (15). The electromagnetic radiation is primarily intended to be in the terahertz (THz) frequency range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.