Patent · US Expired

Method for making an electronic component with self-aligned drain and gate, in damascene architecture

US6867128B2 · kind B2 · utility

13Cited by
8References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 8, 2001
Grant dateMar 15, 2005
Priority date
Expiry dateJun 8, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/258
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating an electronic component with a self-aligned source, drain and gate. The method includes forming a dummy gate on a silicon substrate, in which the dummy gate defines a position for a channel of the component. The method also includes at least one implantation of doping impurities in the substrate, to form a source and a drain on either side of the channel, using the dummy gate as an implanting mask, superficial, self-aligned siliciding of the source and drain, depositing at least one contact metal layer having a total thickness greater than a height of the dummy gate, polishing the at least one contact metal layer stopping at the dummy gate, and replacing the dummy gate by at least one final gate separated from the substrate by a gate insulating layer, and electrically insulated from the source and drain. Further, depositing the at least one contact metal layer includes depositing a first metal layer and, above the first metal layer, a second metal layer having a greater mechanical resistance to polishing than the first metal layer. In addition, a thickness of the first metal layer is less than the height of the dummy gate, and a total thickness of the first…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.