Semiconductor integrated circuit tester with pivoting interface unit
US6867578B1 · kind B1 · utility
4Cited by
5References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 3, 2002 |
| Grant date | Mar 15, 2005 |
| Priority date | — |
| Expiry date | Sep 3, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2889
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semiconductor integrated circuit tester includes a generally parallelepipedal housing, a main tester board in the housing, and an interface unit incorporating a tester interface that is connected to the main tester board. A support mechanism supports the interface unit in a manner allowing pivotal movement of the interface unit relative to the housing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.