Automated multi-device test process and system
US6868513B1 · kind B1 · utility
12Cited by
12References
12Claims
0Family size
Assignee
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Key dates
| Filing date | Oct 26, 2000 |
| Grant date | Mar 15, 2005 |
| Priority date | — |
| Expiry date | Mar 14, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31912
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, system and software for automatically generating a test environment for testing a plurality of devices (DUTs) under test in a test system. The multiple devices are tested by mapping the plurality of DUTs into pins of the tester system to create pin data; inputting into a test program generator pattern data, generic test program rules and the pin data; generating a multi-DUT test program and multi-DUT pattern data; and controlling the test system through the test program. The resulting fail data is then logged to each DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.