Dale B. Grosch
2Patents
2h-index
8Co-inventors
30Inventor score
Filing activity: Oct 26, 2000 → Feb 25, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7222274B2 | Testing and repair methodology for memories having redundancy | Physics | 13 | Expired |
| US6868513B1 | Automated multi-device test process and system | Physics | 12 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.