Patent · US Expired

Method for producing organic electronic devices on deposited dielectric materials

US6869821B2 · kind B2 · utility

10Cited by
8References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 2002
Grant dateMar 22, 2005
Priority date
Expiry dateFeb 7, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10K10/466
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A deposited dielectric (e.g., PECVD silicon nitride) formed on an inexpensive glass or plastic foil substrate is modified to facilitate the formation of high mobility organic semiconductor films. In one embodiment, the dielectric is plasma treated using nitrogen or argon gas to reduce the surface roughness of the dielectric layer below 5 nm (peak-to-valley). An organic semiconductor film (e.g., pentacene) grown on the modified dielectric exhibits high mobility and large polycrystalline grain sizes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.