Patent · US Expired

Method and device for characterizing a CMOS logic cell to be produced in a technology of the partially depleted silicon-on-insulator type

US6871330B2 · kind B2 · utility

2Cited by
3References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 29, 2003
Grant dateMar 22, 2005
Priority date
Expiry dateMay 29, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/367
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for characterizing a CMOS logic cell of the partially depleted silicon-on-insulator type (PD-SOI) may include modeling the logic cell and determining internal potentials of transistors of the cell in a dynamic equilibrium state based upon a functional simulation of the modeled cell. This may be done using a binary stimulation signal having an initial logic value. The dynamic equilibrium state may be based upon a cancellation, to within a precision error, of the sum of the squares of variations in the quantities of charge in floating substrates of the transistors taken over a period of two successive transitions of the stimulation signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.