Patent · US Expired

Method and apparatus for analyzing electromagnetic interference

US6876210B2 · kind B2 · utility

6Cited by
21References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 27, 2001
Grant dateApr 5, 2005
Priority date
Expiry dateNov 27, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of analyzing electromagnetic interference in which an amount of electromagnetic interference from an LSI is analyzed, wherein the method includes: an equivalent power source current information calculating step of calculating information of an equivalent power source current flowing in a power source current, from circuit information of the LSI chip; an estimating step of considering at least one of power source information of a power source for supplying a current to the LSI chip, package information of a package for the semiconductor chip, and measurement system information of a measurement system for measuring characteristics of the semiconductor chip, as analysis control information, and of estimating total information in which the analysis control information is reflected in the circuit information, as an equivalent circuit; and a total information analyzing step of performing analysis in accordance with the total information which is estimated in the estimating step.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.